Mutation Testing Author

Name: Yunzhan Gong
Affiliation: Academy of Armored Forces Engineering
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1Yunzhan Gong and Wanli Xu and Xiaowei Li
An Expression's Single Fault Model and the Testing Methods
Proceedings of the 12th Asian Test Symposium (ATS'03)Xian, China, 16-19 November 2003.
BibTeX | Abstract | URL